HST (High-Speed Transient) Temperature Detection Microscopy:
The HST (High-Speed Transient) temperature detector is normally used in conjunction with the main steady state InfraScopeTM TM Temperature Mapping Microscope to obtain high-speed transient data at a single point of interest. It is appropriate for applications that require sub-millisecond temperature resolution.
Dual Sensor MWIR Temperature Measurement and HST Solution
The detector output is fed to high gain, high bandwidth preamp and digitized by a 16 b100 Msample/second digital scope board. QFI’s transient software integrates with the InfraScope imaging software for pointing the detector and also provides automatic emissivity correction. Temperature versus time is presented in an oscilloscope type format.
In typical operation, Temperature Mapping software is utilized to locate areas of interest, from which specific targets are selected for the transient detector measurements. Once targeted, the measured temperature is displayed in ‘oscilloscope’ format.
This technique has proven effective for measuring transient junction temperatures in RF devices and in MEMS devices such as ink jet print heads. Sensor is appropriate for both front side and backside probing.
HST Quickly Outputs Temperature vs. Time in Oscilloscope Format
QFI’s transient option is a single element, high-speed thermal detector, that is centered on the main InfraScopeTM TM image and uses the same optics and the same measurement set-up.
The single element can be digitized at very high rates.
The transient software integrates with the main InfraScopeTM TM imaging software. It provides emissivity correction, and quickly outputs temperature vs. time in an oscilloscope format.
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