IC Failure Analysis Microscopy >Emmi Photon Emission Detection > Patented Macro Technology

PATENTED MACRO TECHNOLOGY

All QFI emmi models feature a patented 2 part macro lens that lets the failure analysis engineer see the whole die but our macro eliminates the common penalty of low sensitivity at macro magnifications. In fact our low magnification macros are optically very sensitive. This means the FA worker can efficiently locate the fault at the lowest magnification without having to perform a tedious search with a high magnification objective. QFI offers this patented macro lens technology optimized for either camera technology. Demand this macro for successful and timely fault isolation.

The Infrascope III is available on a dedicated optical head as pictured at right, or on QFI's Multi Sensor Platform as seen at left. The Multi Sensor Platform combines the
LSIM with Emission Microscopy
and IR Thermal Hot Spot Detection.

  Home | IC Failure Analysis Microscopy | Micro Thermal Mapping | About QFI | Contact QFI | Library | Partners & Links | Directions to QFI | Email | Sales