IC Failure Analysis Microscopy > InfraScope Hot Spot Detection

INFRASCOPE III

The InfraScope III is the latest and most sensitive InfraScope in 50 years of Barnes & QFI thermal microscope development. Born from Cold War infrared technology, the InfraScope III has been optimized for Failure Analysis. QFI has fused technology and experience from the emmi FA products and our well known InfraScope thermal mapper to make the worlds most sensitive infrared shorts and hot spots detector. We have carried forward the the mature, sensitive InSb detector technology from the InfraScope II thermal mapper. Now it is available in 500x500 pixels format with 24 micron pixels. We have designed all new micro-objective lenses with more gathering power and higher numerical apertures, to make the most sensitive InfraScope yet. We have included a high numerical aperture macro lens just like our patented emmi macro, except this one is designed and manufactured from infrared lens materials, AR coated silicon and germanium. The result? Stunning infrared hot-spot detection and isolation for front or backside inspection.

The Infrascope III is available on a dedicated optical head as pictured at right, or on QFI's Multi Sensor Platform as seen at left. The Multi Sensor Platform combines the InfraScope with Emission Microscopy and Laser Signal Injection Microscopy (LSIM).

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