IC Failure Analysis Microsocopy

IC Failure Analysis Microsocopy

QFI makes specialized microscopes used by the semiconductor industry to locate defects on large scale integrated circuits.

Laser Signal Injection

InfraScope Hot Spot Detection

emmi Photon Emission Detection

FA Tool Options

Test Services

InfraScope infrared image finds hot spots indicating locations of shorted circuit.

  Home | IC Failure Analysis Microscopy | Micro Thermal Mapping | About QFI | Contact QFI | Library | Partners & Links | Directions to QFI | Email | Sales